Yao-Feng Chang and Prof. Jack Lee Receive ISNE Best Student Paper Award
Texas ECE graduate student Yao-Feng Chang and Prof. Jack Lee have received the 2015 Best Student Paper Award from the IEEE International Symposium on Next-Generation Electronics (ISNE) Conference. The award was given to their paper "Study of SiOx-Based Resistive Switching Memory (ReRAM) in Integrated One-Diode One-Resistor (1D-1R) Architecture.” It was announced earlier this week in Taipei, Taiwan.
The IEEE International Symposium on Next-Generation Electronics (ISNE) conference covers a wide range of scientific topics, including nanomaterials, nanofabrication, semiconductor lasers and LEDs, photonic and optical devices, photonic communications, fiber optics and solid-state lighting technology.
Yao-Feng Chang received the B.S. degrees in electrical engineering from National Sun Yat-sen University in 2007; and the M.S. degree in Electronics Engineering from National Chiao Tung University in 2009. From 2011 to 2012, he was an intern at the SEMATECH, Austin, in the ReRAM Program, and worked on reliability testing and modeling. From 2013 to 2014, he was a research scientist at the PrivaTran (a build-up company). He has published over 20 journal publications and 20 conference proceedings and has been awarded numerous research awards and one patent.